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Equipment name: scanning electron microscope
Equipment model: Hitachi su5000
Main technical indicators: Se probe resolution: 7.0nm @ 3KV; BSE probe resolution: 10.0nm @ 5kV; Inner diameter of sample bin = 320mm; Sample table size: loading diameter = 200mm sample
Quantity: 1 set

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Copyright © 2021 Jiangsu Jicui Micro-Nano Automation System and Equipment Technology Research Ins.
ICP：苏ICP备18027260号Technical support: Suzhou Munich